Electroforming-free TaOx memristors using focused ion beam irradiations

Characterization of electroforming-free titanium dioxide memristors

Metal-insulator-metal (MIM) structures based on titanium dioxide have demonstrated reversible and non-volatile resistance-switching behavior and have been identified with the concept of the memristor. Microphysical studies suggest that the development of sub-oxide phases in the material drives the resistance changes. The creation of these phases, however, has a number of negative effects such a...

Sculpting on polymers using focused ion beam

Available online 13 June 2008 It has been recently shown t

Microscale Metallography Using Focused Ion Beam

Microstructural examination can provide a rich tapestry of information about the processing and application history of a metal component. For this reason, microstructural characterization is a fundamental tool for failure analysis of these components. To reduce costs and accommodate demands for smaller packaging, many applications currently use metallic components where the critical dimensions ...

Focused Ion Beam Lithography

Imaging Nanophotonic Modes of Microresonators using a Focused Ion Beam.

Optical microresonators have proven powerful in a wide range of applications, including cavity quantum electrodynamics1-3, biosensing4, microfludics5, and cavity optomechanics6-8. Their performance depends critically on the exact distribution of optical energy, confined and shaped by the nanoscale device geometry. Near-field optical probes9 can image this distribution, but the physical probe ne...